Experimental analysis on stochastic behavior of preswitching time in STT-MRAM
نویسندگان
چکیده
In this paper we present an experimental study on the preswitching time of Spin-Transfer Torque Magnetic Random-Access Memory (STT-MRAM) with a resistance area R.A. ~ 12 Ω.μm2, for both transitions, Anti-Parallel to Parallel state and vice versa. A set measurements is carried out operating at different applied voltages temperatures ranging from 25 °C 90 °C. As main results our analysis, show decrease temperature increase. The Arrhenius law enables extraction activation energy required switch cell in states. Finally, establish relevant transition probabilities using Weibull distribution that best fits results. parameters highlight stochasticity variability switching characteristics STT-MRAM device, useful high reliability applications.
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ژورنال
عنوان ژورنال: Microelectronics Reliability
سال: 2022
ISSN: ['0026-2714', '1872-941X']
DOI: https://doi.org/10.1016/j.microrel.2022.114677